SAN JOSE, Calif., May 14 /PRNewswire-FirstCall/ -- LogicVision, Inc. (NASDAQ: LGVN), a leading provider of test and yield learning solutions, will present at The Seventh Annual JMP Securities Research Conference in San Francisco, California. Mr. James T. Healy, LogicVision's president and CEO, and Mr. Bruce M. Jaffe, LogicVision's chief financial officer are scheduled to present on Tuesday, May 20, 2008. During the presentation, management will briefly outline its value proposition as the semiconductor world embraces testing system-on-a-chip (SoC) semiconductors from the inside and will conduct a conversation with a JMP Securities analyst about the Company's business and business climate. A webcast of the presentation will be available:

    Date:      Tuesday, May 20, 2008
    Time:      3:00 P.M. Eastern Time / 12:00 P.M. Pacific Time for the live
               presentation
    Location:  On the web at http://investor.shareholder.com/lgvn/events.cfm
    Replay:    Available one hour after the presentation ends and accessible
               for 90 days.

About LogicVision, Inc.

LogicVision (NASDAQ: LGVN) provides proprietary technologies for embedded test and yield learning that enable more efficient manufacturing test of complex semiconductors. LogicVision's embedded test solutions allow integrated circuit designers to embed test functionality into a semiconductor design that is used during semiconductor production test and throughout the useful life of the chip. The company's advanced Design for Test (DFT) product line, ETCreate, works together with Silicon Insight applications and Yield Insight to improve profit margins by reducing device field returns and test costs, accelerating silicon bring-up times and shortening both time to market and time to yield. For more information on the company and its products, please visit the LogicVision website at www.logicvision.com.

Web site: http://www.logicvision.com/