Call for Papers: 2017 ACM/IEEE Workshop on Variability Modeling and Characterization (VMC)

Co-located with ACM/IEEE ICCAD, November 16, 2017, Irvine, CA, USA

http://www.cerc.utexas.edu/utda/vmc/

Background

Sept 5, 2017 -- Variability has emerged as a fundamental challenge to IC design in scaled CMOS technology; and it has profound impact on nearly all aspects of circuit performance. While some of the negative effects of variability can be handled via improvements in the manufacturing process, comprehensive methods are necessary to assess and manage the negative effects of variability, which in turn requires accurate and tractable variability models. The goal of the VMC workshop is to provide a forum for theoreticians and practitioners to freely exchange opinions on current practices as well as future research needs in variability modeling and characterization.

The workshop organizers strongly encourage the submission of early results in the related topics. The submissions will be evaluated by the Technical Program Committee, and the author(s) of the accepted submissions are expected to present the results in the format of posters and few-minutes introductory presentations at the workshop. Proceedings of the workshop are limited to the attendees.

Topics

1. Fundamental physics of device variability
2. Compact variability modeling development and applications
3. Statistical extraction of variability
4. Variability test structure design and calibration
5. Design interface with manufacturing and solutions for variability
6. Variability issues in emerging semiconductor technology
7. Temporal variability issues
8. Reliability considerations that may be closely related to variability
9. Variability in computing and systems

Technical Program Committee

Co-chairs:
Abe Elfadel, Masdar Institute, Abu Dhabi
Takashi Sato, Kyoto University, Japan
Rasit O. Topaloglu, IBM, USA

Members:
Yu Cao, Arizona State University, USA
Chris Kim, University of Minnesota, USA
Colin McAndrew, Freescale, USA
Subhashish Mitra, Stanford University, USA
Hidetoshi Onodera, Kyoto University, Japan
David Pan, UT Texas, USA
Vijay Reddy, Texas Instruments, USA

Submission

Two page maximum in US Letter or A4 format. Submit your work here:
https://easychair.org/conferences/?conf=vmc17

Submission:  September 15, 2017

Acceptance:  October 1, 2017

Featured Video
Jobs
Senior Principal Software Engineer for Autodesk at San Francisco, California
Machine Learning Engineer 3D Geometry/ Multi-Modal for Autodesk at San Francisco, California
Principal Engineer for Autodesk at San Francisco, California
Mechanical Engineer 3 for Lam Research at Fremont, California
GIS Specialist for Washington State Department of Natural Resources at Olympia, Washington
Manufacturing Test Engineer for Google at Prague, Czechia, Czech Republic
Upcoming Events
Digital Twins 2024 at the Gaylord National Resort & Convention Center in, MD. National Harbor MD - Dec 9 - 11, 2024
Commercial UAV Expo 2025 at RAI Amsterdam Amsterdam Netherlands - Apr 8 - 11, 2025
Commercial UAV Expo 2025 at Amsterdam Netherlands - Apr 8 - 10, 2025
BI2025 - 13th Annual Building Innovation Conference at Ritz-Carlton Tysons Corner McLean VA - May 19 - 21, 2025



© 2024 Internet Business Systems, Inc.
670 Aberdeen Way, Milpitas, CA 95035
+1 (408) 882-6554 — Contact Us, or visit our other sites:
TechJobsCafe - Technical Jobs and Resumes EDACafe - Electronic Design Automation GISCafe - Geographical Information Services  MCADCafe - Mechanical Design and Engineering ShareCG - Share Computer Graphic (CG) Animation, 3D Art and 3D Models
  Privacy PolicyAdvertise