NORWOOD, Mass. — (BUSINESS WIRE) — October 4, 2012 — Analog Devices, Inc. (ADI), a global leader in high-performance semiconductors for signal processing applications, introduced today the industry’s first MEMS accelerometer with Min/Max offset sensitivity over the full temperature range. The ADXL350 3-axis MEMS accelerometer has maximum offset temperature sensitivity of ±0.31 mg/°C on the X/Y axes and ±0.49 mg/°C on the Z axis, guaranteeing predictable and quantifiable performance across the full temperature range of −40°C to +85°C. MEMS accelerometers on the market today specify only typical offset sensitivity to temperature, requiring calibration over temperature to maintain accurate sensor readings. The ADXL350 Min/Max offset sensitivity to temperature specifications guarantee known, quantifiable offset sensor measurements even in applications that are subjected to a wide temperature range. Additionally, the ADXL350 offers low noise density enabling designers to obtain valid measurements from applications with a low noise floor.

The ADXL350 offers on-board analog to digital conversion with 13-bit resolution, as low as 2 mg/LSB, and is configurable to ±1g/2g/4g/8g range settings. The ADXL350 is available in a small footprint 3-mm x 4-mm x 1.2-mm, 16-lead, plastic-cavity laminate package. The ADXL350 is well suited for high-performance applications in industrial and defense industries such as gas/water meters, environmental monitors and military communications radios.

• View the ADXL350 MEMS accelerometer product page, order samples and download the data sheet: http://www.analog.com/ADXL350
• Order evaluation boards: http://www.analog.com/ADXL350
• Connect with engineers and ADI product experts on EngineerZone^™, an online technical support community: http://ez.analog.com/community/mems

ADXL350 MEMS Accelerometer Key Features and Benefits:

• Min/Max offset sensitivity to temperature of ±0.31 mg/°C X/Y axes and ±0.49 mg/°C Z axis guarantees predictable and quantifiable performance across full temperature range
• 2 mg/LSB resolution with a 13-bit on-chip A/D converter enables measurement of inclination changes less than 1.0°
• Low power modes enable intelligent motion-based power management with threshold sensing and active acceleration measurement at extremely low power dissipation